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Estimation of thickness using EDS #112

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@tcsousa99

Dear exspy community, I am really happy to learn today about the existance of this open-source project! Congrats for all the work done.

Describe the functionality you would like to see.

A method to estimate thickness using EDS spectra.

Describe the context

I am working in nuclear fusion research and studying materials for tokamaks and diagnostic systems. Recently we wanted to estimate the thickness lost of a coating before and after exposure to plasma. We measured several points in a sample (around 100) and for each point we use 5 different electron beam energies (5, 10, 15, 20, 25kV). These points are the sames for before and after, this is a general method to estimate thickness.

Then we use a old very clanky software called STRATAGem to calculate these thicknesses. But it is very hard to automate it. I think if I would use exspy it would be much quicker. I can easily extract the quantification from the Genesis EDAX sofware. But I did not find the in the user guid in esxpy a way to estimate thickness using EDS (only EELS). Is this implemented already?

Additional information

Attached is the thoery and user manual of stratagem to give an idea.

Thank you!

Stratagemus.pdf

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