Dear exspy community, I am really happy to learn today about the existance of this open-source project! Congrats for all the work done.
Describe the functionality you would like to see.
A method to estimate thickness using EDS spectra.
Describe the context
I am working in nuclear fusion research and studying materials for tokamaks and diagnostic systems. Recently we wanted to estimate the thickness lost of a coating before and after exposure to plasma. We measured several points in a sample (around 100) and for each point we use 5 different electron beam energies (5, 10, 15, 20, 25kV). These points are the sames for before and after, this is a general method to estimate thickness.
Then we use a old very clanky software called STRATAGem to calculate these thicknesses. But it is very hard to automate it. I think if I would use exspy it would be much quicker. I can easily extract the quantification from the Genesis EDAX sofware. But I did not find the in the user guid in esxpy a way to estimate thickness using EDS (only EELS). Is this implemented already?
Additional information
Attached is the thoery and user manual of stratagem to give an idea.
Thank you!
Stratagemus.pdf
Dear exspy community, I am really happy to learn today about the existance of this open-source project! Congrats for all the work done.
Describe the functionality you would like to see.
A method to estimate thickness using EDS spectra.
Describe the context
I am working in nuclear fusion research and studying materials for tokamaks and diagnostic systems. Recently we wanted to estimate the thickness lost of a coating before and after exposure to plasma. We measured several points in a sample (around 100) and for each point we use 5 different electron beam energies (5, 10, 15, 20, 25kV). These points are the sames for before and after, this is a general method to estimate thickness.
Then we use a old very clanky software called STRATAGem to calculate these thicknesses. But it is very hard to automate it. I think if I would use exspy it would be much quicker. I can easily extract the quantification from the Genesis EDAX sofware. But I did not find the in the user guid in esxpy a way to estimate thickness using EDS (only EELS). Is this implemented already?
Additional information
Attached is the thoery and user manual of stratagem to give an idea.
Thank you!
Stratagemus.pdf